L. S. ALI, D.; W. F. MOHAMAD, D. New Analysis to Measure the Capacitance and Conductance of MOS Structure. Al-Rafidain Engineering Journal (AREJ), [S. l.], v. 14, n. 1, p. 47–57, 2006. DOI: 10.33899/rengj.2006.46241. Disponível em: https://jamh.uomosul.edu.iq/index.php/arej/article/view/30873. Acesso em: 7 sep. 2025.